Advanced high performance semiconductor devices can be sensitive to Single Event Latch-Up (SEL) effect when exposed under radiation in the space environment. Even if SEL is a very rare event, it can lead to device destruction. A safe design for a mission critical application shall include a protection device called the Latch-Up current Limiter (LCL).
The 3DPM0168-2 LCL monitors the power supply line of the radiation sensitive device and switches it off instantaneously in case of “radiation induced SEL”.
Featuring specific radiation effect mitigation techniques and utilizing space design derating rules, the Rad Hard by Design 3DPM0168-2 LCL is an ITAR Free product and features a SEL/SET LETth of 80 Mev.cm2/mg and a TID of 50krad (Si).
The 3DPM0168-2 is manufactured with 3D Plus Space Qualified stacking technology designed for high reliability applications, and is available in a compact size and low weight 20-pins SOP package 1.27mm.
Applications
Protection of sensitive digital circuits, for example : ASICs, FPGAs, etc …
